| 編號(hào) | 中文名稱 | 英文名稱 |
|---|
| IEC 60122-1-2002
| 經(jīng)過質(zhì)量評(píng)定的石英晶體元件.第1部分:總規(guī)范
| Quartz crystal units of assessed quality - Part 1: Generic specification
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| IEC 60122-2-1 AMD 1-1993
| 頻率控制和選擇用石英晶體元件 第2部分:頻率控制和選擇用石英晶體元件使用指南 第1節(jié):微處理器鐘用石英晶體
| Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; section 1: quartz crystal units for microprocessor clock supply
|
| IEC 60122-2-1-1991
| 頻率控制和選擇用石英晶體元件 第2部分:頻率控制和選擇用石英晶體元件使用指南 第1節(jié):微處理器時(shí)鐘用石英晶
| Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; section 1: quartz crystal units for microprocessor clock supply
|
| IEC 60122-2-1983
| 頻率控制和選擇用石英晶體元件 第2部分:頻率控制和選擇用石英晶體元件使用指南
| Quartz crystal units for frequency control and selection. Part 2 : Guide to the use of quartz crystal units for frequency control and selection
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| IEC 60122-3-2001
| 經(jīng)質(zhì)量評(píng)定的石英晶體元件 第3部分：標(biāo)準(zhǔn)外形和引線連接
| Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
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| IEC 60314 AMD 1-1979
| 石英晶體諧振器的溫度控制裝置.第1次修改
| Temperature control devices for quartz crystal units
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| IEC 60314-1970
| 石英晶體諧振器的溫度控制裝置
| Temperature control devices for quartz crystal units
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| IEC 60368-2-1-1988
| 壓電濾波器 第2部分:壓電濾波器使用指南 第1節(jié):石英晶體濾波器
| Piezoelectric filters. Part 2: Guide to the use of piezoelectric filters. Section One - Quartz crystal filters
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| IEC 60444-1 AMD 1-1999
| 用π型網(wǎng)絡(luò)零相位技術(shù)測(cè)量石英晶體元件參數(shù) 第1部分:用π型網(wǎng)絡(luò)零相位技術(shù)測(cè)量石英晶體元件的諧振頻率和諧
| Measurement of quartz crystal unit parameters by zero phase technique in a -network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network; Amendment 1
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| IEC 60444-1-1986
| 用π型網(wǎng)絡(luò)零相位技術(shù)測(cè)量石英晶體元件參數(shù) 第1部分:用π型網(wǎng)絡(luò)零相位技術(shù)測(cè)量石英晶體元件的諧振頻率和諧
| Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network
|
| IEC 60444-2-1980
| 用π型網(wǎng)絡(luò)零相位技術(shù)測(cè)量石英晶體元件參數(shù) 第2部分:測(cè)量石英晶體元件動(dòng)態(tài)電容的相位偏置法
| Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units
|
| IEC 60444-4-1988
| 用π型網(wǎng)絡(luò)的零相位技術(shù)測(cè)量石英諧振器參數(shù).第4部分:石英晶體元件負(fù)荷諧振頻率fl、負(fù)荷諧振電阻Rl的測(cè)量方
| Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 4: method for the measurement of the load resonance frequency FL load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
|
| IEC 60444-5-1995
| 石英晶體元件參數(shù)的測(cè)量 第5部分:采用自動(dòng)網(wǎng)絡(luò)分析技術(shù)和誤差校正確定等效電參數(shù)的方法
| Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
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| IEC 60444-6-1995
| 石英晶體元件參數(shù)的測(cè)量 第6部分:激勵(lì)電平相關(guān)性(DLD)的測(cè)量
| Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
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| IEC 60444-7-2004
| 石英晶體元件參數(shù)的測(cè)量.第7部分:石英晶體元件的放射性和頻率下降測(cè)量
| Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
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| IEC 60444-8-2003
| 石英晶體元件參數(shù)的測(cè)量.第8部分:表面安裝的石英晶體元件用試驗(yàn)設(shè)備
| Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
|
| IEC 60444-9-2007
| 石英晶體元件參數(shù)測(cè)量.第9節(jié):壓電晶體元件寄生振蕩測(cè)量
| Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
|
| IEC 60455-3-2-2003
| 電氣絕緣用樹脂基復(fù)合物.第3部分:單項(xiàng)材料規(guī)范.活頁2:填石英的環(huán)氧樹脂復(fù)合物
| Resin based reactive compounds used for electrical insulation - Part 3: Specifications for individual materials; Sheet 2: Quartz filled epoxy resinous compounds
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| IEC 60679-1-2007
| 經(jīng)質(zhì)量評(píng)定的石英晶體振蕩器.第1部分:總規(guī)范
| Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
|
| IEC 60679-2-1981
| 石英晶體振蕩器 第2部分:石英晶體振蕩器使用指南
| Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
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| IEC 60679-3-2001
| 經(jīng)質(zhì)量評(píng)定的石英晶體控制振蕩器 第3部分：標(biāo)準(zhǔn)外形和引線連接
| Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
|
| IEC 60679-4-1-1998
| 經(jīng)質(zhì)量評(píng)定的石英晶體振蕩器 第4-1部分:空白詳細(xì)規(guī)范 能力批準(zhǔn)
| Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
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| IEC 60679-4-1997
| 經(jīng)質(zhì)量評(píng)定的石英晶體振蕩器 第4部分:分規(guī)范 能力批準(zhǔn)
| Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
|
| IEC 60679-5-1-1998
| 經(jīng)質(zhì)量評(píng)定的石英晶體振蕩器 第5-1部分:空白詳細(xì)規(guī)范 鑒定批準(zhǔn)
| Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval
|
| IEC 60679-5-1998
| 經(jīng)質(zhì)量評(píng)定的石英晶體振蕩器 第5部分:分規(guī)范 鑒定批準(zhǔn)
| Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
|
| IEC 60682 AMD 1-1987
| 石英鹵鎢燈夾封部位溫度的標(biāo)準(zhǔn)測(cè)量方法 修改1
| Standard method of measuring the pinch temperature of quartz-tungstenhalogen lamps
|
| IEC 60682 AMD 2-1997
| 石英鹵鎢燈夾封部位溫度的標(biāo)準(zhǔn)測(cè)量方法 修改2
| Method of measuring the pinch temperature of quartz glass lamps; Amendment 2
|
| IEC 60682-1980
| 石英鹵鎢燈夾封部位溫度的標(biāo)準(zhǔn)測(cè)量方法
| Standard method of measuring the pinch temperature of quartz-tungstenhalogen lamps
|
| IEC 60689-1980
| 手表用32kHz石英晶體元件的測(cè)量方法、試驗(yàn)方法和標(biāo)準(zhǔn)值
| Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values
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| IEC 60758-2004
| 人造石英晶體.規(guī)范和使用指南
| Synthetic quartz crystal - Specifications and guide to the use
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| IEC 61080-1991
| 石英晶體元件等效電參數(shù)測(cè)量指南
| Guide to the measurement of equivalent electrical parameters of quartz crystal units
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| IEC 61178-2-1-1993
| 石英晶體元件 IEC電子元器件質(zhì)量評(píng)定體系(IECQ)規(guī)范 第2部分:分規(guī)范 能力批準(zhǔn) 第1節(jié):空白詳細(xì)規(guī)范
| Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 2: sectional specification; capability approval; section 1: blank detail specification
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| IEC 61178-2-1993
| 石英晶體元件 IEC電子元器件質(zhì)量評(píng)定體系(IECQ)規(guī)范 第2部分:分規(guī)范 能力批準(zhǔn)
| Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 2: sectional specification; capability approval
|
| IEC 61178-3-1-1993
| 石英晶體元件 IEC電子元器件質(zhì)量評(píng)定體系(IECQ)規(guī)范 第3部分:分規(guī)范 鑒定批準(zhǔn) 第1節(jié):空白詳細(xì)規(guī)范
| Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 3: sectional specification; qualification approval; section 1: blank detail specification
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| IEC 61178-3-1993
| 石英晶體元件 IEC電子元器件質(zhì)量評(píng)定體系(IECQ)規(guī)范 第3部分:分規(guī)范 鑒定批準(zhǔn)
| Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 3: sectional specification; qualification approval
|
| IEC/TR 60444-3-1986
| 用π型網(wǎng)絡(luò)零相位技術(shù)測(cè)量石英晶體元件參數(shù) 第3部分:利用有并聯(lián)電容Co補(bǔ)償?shù)摩行途W(wǎng)絡(luò)相位技術(shù)測(cè)量頻率達(dá)200
| Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 3: basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a w-network with compensation of the parallel capacitance C<(Index)0>
|
| IEC/TS 61994-4-1-2007
| 頻率控制和選擇用壓電和介電裝置.術(shù)語.第4-1部分:壓電材料.合成石英晶體
| Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
|
| ISO 10553-2003
| 鐘表學(xué).石英表精度評(píng)價(jià)規(guī)程
| Horology - Procedure for evaluationg the accuracy of quartz watches
|
| ISO 10650-1-2004
| 牙科學(xué).動(dòng)力聚合活化劑.第1部分:石英鎢鹵素?zé)? | Dentistry - Powered polymerization activators - Part 1: Quartz tungsten halogen lamps
|
| ISO 1772-1975
| 實(shí)驗(yàn)室用瓷坩堝和石英坩堝
| Laboratory crucibles in porcelain and silica
|
| ISO 3262-13-1997
| 涂料用填充劑 規(guī)范和試驗(yàn)方法 第13部分:天然石英(礦物)
| Extenders for paints - Specifications and methods of test - Part 13: Natural quartz (ground) |
| ISO 3262-15-2000
| 涂料用填充劑 規(guī)范和試驗(yàn)方法 第15部分:透明石英
| Extenders for paints - Specifications and methods of test - Part 15: Vitreous silica
|
| ISO 3262-19-2000
| 涂料用填充劑 規(guī)范和試驗(yàn)方法 第19部分:沉淀二氧化硅(石英)
| Extenders for paints - Specifications and methods of test - Part 19: Precipitated silica
|
| ISO 3262-20-2000
| 涂料用填充劑 規(guī)范和試驗(yàn)方法 第20部分:噴霧二氧化硅(石英)
| Extenders for paints - Specifications and methods of test - Part 20: Fumed silica
|
| ISO 3262-21-2000
| 涂料用填充劑 規(guī)范和試驗(yàn)方法 第21部分:石英砂(礦物天然石英)
| Extenders for paints - Specifications and methods of test - Part 21: Silica sand (unground natural quartz)
|
| ISO 4791-1-1985
| 實(shí)驗(yàn)室儀器 玻璃、瓷器或透明石英制品儀器的基本詞匯 第1部分:儀器名稱 三種語言版
| Laboratory apparatus; Vocabulary relating to apparatus made essentially from glass, porcelain or vitreous silica; Part 1 : Names for items of apparatus Trilingual edition
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| 編號(hào) | 中文名稱 | 英文名稱 |
|---|